Academic Journal
Effect of resistivity on small edge localized mode
| العنوان: | Effect of resistivity on small edge localized mode |
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| المؤلفون: | Wu, N., Chen, S. Y., Mou, M. L., Tang, C. J. |
| المساهمون: | National Natural Science Foundation of China |
| المصدر: | Physics of Plasmas ; volume 25, issue 9 ; ISSN 1070-664X 1089-7674 |
| بيانات النشر: | AIP Publishing |
| سنة النشر: | 2018 |
| الوصف: | The effect of resistivity on small edge localized mode (ELM) is investigated based on the peeling-ballooning three-field module of BOUT++. The ELM size increases with increasing resistivity, which is attributed to both linear growth rate and turbulence intensity. In the high resistivity case, a large linear growth rate causes a fierce initial collapse of pedestal, and the short duration of the zonal flow results in weak turbulence suppression, leading to more additional energy loss in the turbulence transport phase. This work is expected to provide some reference on understanding small ELM. |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | English |
| DOI: | 10.1063/1.5038042 |
| DOI: | 10.1063/1.5038042/15886858/092305_1_online.pdf |
| الاتاحة: | http://dx.doi.org/10.1063/1.5038042 https://pubs.aip.org/aip/pop/article-pdf/doi/10.1063/1.5038042/15886858/092305_1_online.pdf |
| رقم الانضمام: | edsbas.61EC34CC |
| قاعدة البيانات: | BASE |
| DOI: | 10.1063/1.5038042 |
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