Academic Journal
Multi-scale, Multi-physics Modeling and Simulation of Single Event Effects in Digital Electronics: from Particles to Systems
| العنوان: | Multi-scale, Multi-physics Modeling and Simulation of Single Event Effects in Digital Electronics: from Particles to Systems |
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| المؤلفون: | Autran, Jean-Luc, Munteanu, Daniela |
| المساهمون: | Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), Institut de Physique de Rennes (IPR), Université de Rennes (UR)-Centre National de la Recherche Scientifique (CNRS) |
| المصدر: | ISSN: 0018-9499. |
| بيانات النشر: | HAL CCSD Institute of Electrical and Electronics Engineers |
| سنة النشر: | 2024 |
| المجموعة: | Université de Toulon: HAL |
| مصطلحات موضوعية: | circuit simulation, compact models, device modeling and simulation, digital circuits, digital single-event transient, radiation effects, single-event effects, soft error rate, transport models, radiation transport codes, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [PHYS]Physics [physics] |
| الوصف: | International audience ; This review paper aims to provide a survey of modeling and simulation of single-event effects (SEEs) in digital electronics at device, circuit and system levels. It primarily focuses on the specific multi-scale, multi-physics, multi-domain nature of SEEs and on the main underlying physical mechanisms that lead to the occurrence of single events in digital devices and circuits. This review addresses the different ways to model and simulate both in space and time this complex sequence of mechanisms from the particle-material interaction up to the electrical response of a given electronics device, circuit, or system. It highlights the specific features of each methodology, and discusses simulation requirements, code or model inputs and expected outputs. |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | English |
| Relation: | hal-04333942; https://amu.hal.science/hal-04333942; https://amu.hal.science/hal-04333942/document; https://amu.hal.science/hal-04333942/file/TNS_Review_Autran_Munteanu_2023_HAL.pdf |
| DOI: | 10.1109/TNS.2023.3337288 |
| الاتاحة: | https://amu.hal.science/hal-04333942 https://amu.hal.science/hal-04333942/document https://amu.hal.science/hal-04333942/file/TNS_Review_Autran_Munteanu_2023_HAL.pdf https://doi.org/10.1109/TNS.2023.3337288 |
| Rights: | info:eu-repo/semantics/OpenAccess |
| رقم الانضمام: | edsbas.5B60CABB |
| قاعدة البيانات: | BASE |
| DOI: | 10.1109/TNS.2023.3337288 |
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