Academic Journal
Depth‐Resolved X‐Ray Photoelectron Spectroscopy Evidence of Intrinsic Polar States in HfO 2 ‐Based Ferroelectrics
العنوان: | Depth‐Resolved X‐Ray Photoelectron Spectroscopy Evidence of Intrinsic Polar States in HfO 2 ‐Based Ferroelectrics |
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المؤلفون: | Hill, Megan O, Kim, Ji Soo, Müller, Moritz L, Phuyal, Dibya, Taper, Sunil, Bansal, Manisha, Becker, Maximilian T, Bakhit, Babak, Maity, Tuhin, Monserrat, Bartomeu, Martino, Giuliana Di, Strkalj, Nives, MacManus‐Driscoll, Judith L |
بيانات النشر: | Wiley //dx.doi.org/10.1002/adma.202408572 Advanced Materials |
سنة النشر: | 2024 |
المجموعة: | Apollo - University of Cambridge Repository |
مصطلحات موضوعية: | hafnia, ferroelectricity, x‐ray photoelectron spectroscopy, electrochemistry |
الوصف: | Publication status: Published ; Funder: Herschel Smith Fund ; Funder: Cambridge Display Technology Ltd. ; Funder: Winton Programme for the Physics of Sustainability ; Funder: Gianna Angelopoulos Programme for Science, Technology, and Innovation ; Funder: IISER TVM CHPC ; Funder: IISER TVM PMRF ; |
نوع الوثيقة: | article in journal/newspaper |
وصف الملف: | application/pdf; text/xml |
اللغة: | English |
Relation: | https://www.repository.cam.ac.uk/handle/1810/373628 |
الاتاحة: | https://www.repository.cam.ac.uk/handle/1810/373628 |
Rights: | Attribution 4.0 International ; https://creativecommons.org/licenses/by/4.0/ |
رقم الانضمام: | edsbas.43CC5C95 |
قاعدة البيانات: | BASE |
الوصف غير متاح. |