Conference
Impact of strain and interface traps on the performance of III–V nanowire TFETs
| العنوان: | Impact of strain and interface traps on the performance of III–V nanowire TFETs |
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| المؤلفون: | Gnani, E., Visciarelli, M., Gnudi, A., Reggiani, S., Baccarani, G. |
| المصدر: | 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) ; page 275-278 |
| بيانات النشر: | IEEE |
| سنة النشر: | 2016 |
| نوع الوثيقة: | conference object |
| اللغة: | unknown |
| DOI: | 10.1109/icsict.2016.7998897 |
| الاتاحة: | http://dx.doi.org/10.1109/icsict.2016.7998897 http://xplorestaging.ieee.org/ielx7/7987614/7998614/07998897.pdf?arnumber=7998897 |
| رقم الانضمام: | edsbas.42E95288 |
| قاعدة البيانات: | BASE |
| DOI: | 10.1109/icsict.2016.7998897 |
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