Academic Journal
Thickness dependency of field emission in amorphous and nanostructured carbon thin films
| العنوان: | Thickness dependency of field emission in amorphous and nanostructured carbon thin films |
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| المؤلفون: | Shakerzadeh, Maziar, Teo, Edwin Hang Tong, Tay, Beng Kang |
| المصدر: | Nanoscale Research Letters ; volume 7, issue 1 ; ISSN 1556-276X |
| بيانات النشر: | Springer Science and Business Media LLC |
| سنة النشر: | 2012 |
| الوصف: | Thickness dependency of the field emission of amorphous and nanostructured carbon thin films has been studied. It is found that in amorphous and carbon films with nanometer-sized sp 2 clusters, the emission does not depend on the film thickness. This further proves that the emission happens from the surface sp 2 sites due to large enhancement of electric field on these sites. However, in the case of carbon films with nanocrystals of preferred orientation, the emission strongly depends on the film thickness. sp 2 -bonded nanocrystals have higher aspect ratio in thicker films which in turn results in higher field enhancement and hence easier electron emission. |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | English |
| DOI: | 10.1186/1556-276x-7-286 |
| DOI: | 10.1186/1556-276X-7-286.pdf |
| الاتاحة: | http://dx.doi.org/10.1186/1556-276x-7-286 https://link.springer.com/content/pdf/10.1186/1556-276X-7-286.pdf |
| رقم الانضمام: | edsbas.429DD887 |
| قاعدة البيانات: | BASE |
| DOI: | 10.1186/1556-276x-7-286 |
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