Academic Journal
Wavelet characterization of coarsening during unstable MBE growth
| العنوان: | Wavelet characterization of coarsening during unstable MBE growth |
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| المؤلفون: | Moktadir, Zakaria, Kraft, Michael |
| المصدر: | Microelectronics Journal, 56 (3-6) (2005) |
| بيانات النشر: | Elsevier Science |
| سنة النشر: | 2005 |
| المجموعة: | University of Liège: ORBi (Open Repository and Bibliography) |
| مصطلحات موضوعية: | Engineering, computing & technology, Electrical & electronics engineering, Ingénierie, informatique & technologie, Ingénierie électrique & électronique |
| الوصف: | peer reviewed ; We present a wavelet analysis of coarsening of mounds during molecular beam epitaxy. The advantage in using wavelets over Fourier analysis is that one can track the coarsening process in both, location (direct space) and frequency (or scale) space at the same time. The wavelets concise scale decomposition allows the discrimination of the coarsening process, i.e. tracking coarsening at different scales. |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | English |
| تدمد: | 0026-2692 |
| Relation: | urn:issn:0026-2692; https://orbi.uliege.be/handle/2268/197781; info:hdl:2268/197781; https://orbi.uliege.be/bitstream/2268/197781/1/Microelectronics%20wavelet.pdf |
| DOI: | 10.1016/j.mejo.2005.02.109 |
| الاتاحة: | https://orbi.uliege.be/handle/2268/197781 https://orbi.uliege.be/bitstream/2268/197781/1/Microelectronics%20wavelet.pdf https://doi.org/10.1016/j.mejo.2005.02.109 |
| Rights: | open access ; http://purl.org/coar/access_right/c_abf2 ; info:eu-repo/semantics/openAccess |
| رقم الانضمام: | edsbas.4187F3F1 |
| قاعدة البيانات: | BASE |
| تدمد: | 00262692 |
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| DOI: | 10.1016/j.mejo.2005.02.109 |