التفاصيل البيبلوغرافية
| العنوان: |
TEM assessment of As-doped GaN epitaxial layers grown on sapphire |
| المؤلفون: |
Fay, Mike W., Harrison, Ian, Larkins, Eric C., Novikov, Sergei V., Foxon, C.T., Brown, Paul D. |
| المساهمون: |
McVitie, Stephen, McComb, David |
| بيانات النشر: |
Institute of Physics Publishing |
| سنة النشر: |
2004 |
| المجموعة: |
The University of Nottingham: Nottingham ePrints |
| مصطلحات موضوعية: |
EELS TEM GaN Epitaxy Doping PAMBE |
| الوصف: |
TEM investigations of As-doped GaN layers grown by plasma-assisted molecular beam epitaxy on sapphire substrates reveal the presence of extensive regions of cubic stacking disorder within the hexagonal GaN matrix. Electron energy loss spectroscopy suggests the localization of As within grains immediately below domains containing stacking disorder, and additionally at the layer surface. This suggests that localised strain plays a role in the formation mechanism of the stacking faults. |
| نوع الوثيقة: |
book part |
| اللغة: |
unknown |
| Relation: |
Fay, Mike W., Harrison, Ian, Larkins, Eric C., Novikov, Sergei V., Foxon, C.T. and Brown, Paul D. (2004) TEM assessment of As-doped GaN epitaxial layers grown on sapphire. In: Electron Microscopy and Analysis 2003: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003. Institute of Physics conference series (179). Institute of Physics Publishing, Bristol, pp. 23-26. ISBN 0750309679 |
| الاتاحة: |
http://eprints.nottingham.ac.uk/1442/ |
| رقم الانضمام: |
edsbas.40B76688 |
| قاعدة البيانات: |
BASE |