التفاصيل البيبلوغرافية
| العنوان: |
Criticality of Low-Energy Protons in Single-Event Effects Testing of Highly-Scaled Technologies |
| المؤلفون: |
Rodbell, K. P., LaBel, K. A., Seidleck, C. M., Marshall, Paul W., Castaneda, C. M., Schwank, J. R., Phan, A. M., Kim, H. S., Dodds, N. A., Berg, M. D., Pellish, Jonathan Allen, Gordon, M. S. |
| المصدر: |
CASI |
| سنة النشر: |
2014 |
| المجموعة: |
NASA Technical Reports Server (NTRS) |
| مصطلحات موضوعية: |
Electronics and Electrical Engineering |
| جغرافية الموضوع: |
Unclassified, Unlimited, Publicly available |
| الوصف: |
We report low-energy proton and alpha particle SEE data on a 32 nm silicon-on-insulator (SOI) complementary metal oxide semiconductor (CMOS) static random access memory (SRAM) that demonstrates the criticality of understanding and using low-energy protons for SEE testing of highly-scaled technologies |
| نوع الوثيقة: |
other/unknown material |
| وصف الملف: |
application/pdf |
| اللغة: |
unknown |
| Relation: |
Document ID: 20140008984; http://hdl.handle.net/2060/20140008984 |
| الاتاحة: |
http://hdl.handle.net/2060/20140008984 |
| Rights: |
Copyright, Distribution as joint owner in the copyright |
| رقم الانضمام: |
edsbas.3BBA162D |
| قاعدة البيانات: |
BASE |