Academic Journal
Low-Energy Ion-Induced Single-Event Burnout in Gallium Oxide Schottky Diodes
| العنوان: | Low-Energy Ion-Induced Single-Event Burnout in Gallium Oxide Schottky Diodes |
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| المؤلفون: | Cadena, R. M., Ball, D. R., Zhang, E. X., Islam, S., Senarath, A., McCurdy, M. W., Farzana, E., Speck, J. S., Karom, N., O’Hara, A., Tuttle, B. R., Pantelides, S. T., Witulski, A. F., Galloway, K. F., Alles, M. L., Reed, R. A., Fleetwood, D. M., Schrimpf, R. D. |
| المساهمون: | Air Force Center of Excellence in Radiation Effects |
| المصدر: | IEEE Transactions on Nuclear Science ; volume 70, issue 4, page 363-369 ; ISSN 0018-9499 1558-1578 |
| بيانات النشر: | Institute of Electrical and Electronics Engineers (IEEE) |
| سنة النشر: | 2023 |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | unknown |
| DOI: | 10.1109/tns.2023.3237979 |
| الاتاحة: | http://dx.doi.org/10.1109/tns.2023.3237979 http://xplorestaging.ieee.org/ielx7/23/10103954/10020170.pdf?arnumber=10020170 |
| Rights: | https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html ; https://doi.org/10.15223/policy-029 ; https://doi.org/10.15223/policy-037 |
| رقم الانضمام: | edsbas.3B7EBE44 |
| قاعدة البيانات: | BASE |
| DOI: | 10.1109/tns.2023.3237979 |
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