Academic Journal
Sub-micrometer four-point probe transport measurements on graphene
| العنوان: | Sub-micrometer four-point probe transport measurements on graphene |
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| المؤلفون: | Vonk, K., Verbakel, J. D., Huijink, R., Zandvliet, H. J. W. |
| المصدر: | Review of Scientific Instruments ; volume 94, issue 8 ; ISSN 0034-6748 1089-7623 |
| بيانات النشر: | AIP Publishing |
| سنة النشر: | 2023 |
| الوصف: | Usually, electronic transport measurements on two-dimensional materials, such as graphene and transition metal dichalcogenides, require deposition of electrodes on top of the material, in, for instance, the form of a Hall bar device. In this work, we show that by making use of a collinear micro-four-point probe, electrical transport measurements on small flakes of graphene can be performed without having to fabricate electrodes on top of the flakes. Using probes with probe pitches down to sub-micrometer scale, we show back-gate tuned transport measurements in graphene on silicon oxide and on hexagonal boron nitride. The charge carrier mobilities and the minimum conductivity of graphene are in good agreement with conventional transport measurements. In addition, we assess the possible damage caused by landing these probes on graphene. |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | English |
| DOI: | 10.1063/5.0156309 |
| DOI: | 10.1063/5.0156309/18931300/084707_1_5.0156309.pdf |
| الاتاحة: | http://dx.doi.org/10.1063/5.0156309 https://pubs.aip.org/aip/rsi/article-pdf/doi/10.1063/5.0156309/18931300/084707_1_5.0156309.pdf |
| رقم الانضمام: | edsbas.3B03B984 |
| قاعدة البيانات: | BASE |
| DOI: | 10.1063/5.0156309 |
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