Academic Journal

Soft landing of size selected clusters in rare gas matrices

التفاصيل البيبلوغرافية
العنوان: Soft landing of size selected clusters in rare gas matrices
المؤلفون: Lau, J.T., Ehrke, H.-U., Achleitner, A., Wurth, W.
بيانات النشر: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
سنة النشر: 2003
المجموعة: Vernadsky National Library of Ukraine: DSpace
مصطلحات موضوعية: Electronically Induced Phenomena: Low Temperature Aspects
الوصف: Soft landing of mass selected clusters in rare gas matrices is a technique used to preserve mass selection in cluster deposition. To prevent fragmentation upon deposition, the substrate is covered with rare gas matrices to dissipate the cluster kinetic energy upon impact. Theoretical and experimental studies demonstrate the power of this technique. Besides STM, optical absorption, excitation, and fluorescence experiments, x-ray absorption at core levels can be used as a tool to study soft landing conditions, as will be shown here. X-ray absorption spectroscopy is also well suited to follow diffusion and agglomeration of clusters on surfaces via energy shifts in core level absorption.
نوع الوثيقة: article in journal/newspaper
اللغة: English
تدمد: 0132-6414
Relation: Физика низких температур; Soft landing of size selected clusters in rare gas matrices / J.T. Lau, H.-U. Ehrke, A. Achleitner, W. Wurth // Физика низких температур. — 2003. — Т. 29, № 3. — С. 296-302. — Бібліогр.: 44 назв. — англ.; PACS: 61.46.+w, 87.64.Ni, 36.40.Cg, 36.40.Qv; http://dspace.nbuv.gov.ua/handle/123456789/128818
الاتاحة: http://dspace.nbuv.gov.ua/handle/123456789/128818
رقم الانضمام: edsbas.3810C7BB
قاعدة البيانات: BASE