Academic Journal
Research on the degradation of resolution in cameras based on CMOS image sensor under γ- and X-rays irradiation
العنوان: | Research on the degradation of resolution in cameras based on CMOS image sensor under γ- and X-rays irradiation |
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المؤلفون: | Feng, Jie, Li, Kunfang, Li, Yudong, Liu, Bingkai, Wen, Lin, Guo, Qi |
المساهمون: | National Natural Science Foundation of China, West Light Talent Training Plan of the Chinese Academy of Sciences, Youth Science and Technology Talents Project of Xinjiang Uygur Autonomous, Outstanding Youth Fund of Xinjiang Natural Science Foundation |
المصدر: | Radiation Effects and Defects in Solids ; page 1-11 ; ISSN 1042-0150 1029-4953 |
بيانات النشر: | Informa UK Limited |
سنة النشر: | 2024 |
نوع الوثيقة: | article in journal/newspaper |
اللغة: | English |
DOI: | 10.1080/10420150.2024.2391768 |
الاتاحة: | http://dx.doi.org/10.1080/10420150.2024.2391768 https://www.tandfonline.com/doi/pdf/10.1080/10420150.2024.2391768 |
رقم الانضمام: | edsbas.36FB6A89 |
قاعدة البيانات: | BASE |
DOI: | 10.1080/10420150.2024.2391768 |
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