Academic Journal

Research on the degradation of resolution in cameras based on CMOS image sensor under γ- and X-rays irradiation

التفاصيل البيبلوغرافية
العنوان: Research on the degradation of resolution in cameras based on CMOS image sensor under γ- and X-rays irradiation
المؤلفون: Feng, Jie, Li, Kunfang, Li, Yudong, Liu, Bingkai, Wen, Lin, Guo, Qi
المساهمون: National Natural Science Foundation of China, West Light Talent Training Plan of the Chinese Academy of Sciences, Youth Science and Technology Talents Project of Xinjiang Uygur Autonomous, Outstanding Youth Fund of Xinjiang Natural Science Foundation
المصدر: Radiation Effects and Defects in Solids ; page 1-11 ; ISSN 1042-0150 1029-4953
بيانات النشر: Informa UK Limited
سنة النشر: 2024
نوع الوثيقة: article in journal/newspaper
اللغة: English
DOI: 10.1080/10420150.2024.2391768
الاتاحة: http://dx.doi.org/10.1080/10420150.2024.2391768
https://www.tandfonline.com/doi/pdf/10.1080/10420150.2024.2391768
رقم الانضمام: edsbas.36FB6A89
قاعدة البيانات: BASE
الوصف
DOI:10.1080/10420150.2024.2391768