Academic Journal

Fabrication and characterization of low aberration micrometer-sized electron lenses

التفاصيل البيبلوغرافية
العنوان: Fabrication and characterization of low aberration micrometer-sized electron lenses
المؤلفون: Steinwand, E, Longchamp, J N, Fink, H W
المصدر: Steinwand, E; Longchamp, J N; Fink, H W (2010). Fabrication and characterization of low aberration micrometer-sized electron lenses. Ultramicroscopy, 110(9):1148-1153.
بيانات النشر: Elsevier
سنة النشر: 2010
المجموعة: University of Zurich (UZH): ZORA (Zurich Open Repository and Archive
مصطلحات موضوعية: Physics Institute, 530 Physics
الوصف: Intrinsic spherical aberrations of electron lenses have been the major resolution limiting factor in electron microscopes for several decades. While effective correctors have recently been implemented, an alternative to correct these aberrations is to circumvent them by scaling down lens dimensions by several orders of magnitude. We have fabricated electrostatic lenses exhibiting one micrometer diameter apertures and evaluated their beam forming properties against predictions from numerical ray tracing simulations. It turns out that it is routinely possible to shape a paraxial low-energy electron beam by such micron-sized lenses. Beam profiles have been measured both at a distant detector as well as in a plane close to the lens. It is shown that the lens can form a parallel beam extending no more than 800 nm from the optical axes at a distance of 200 microm beyond the lens exit. We believe that these findings constitute a prerequisite to derive novel tools for high resolution microscopy using low-energy electrons.
نوع الوثيقة: article in journal/newspaper
وصف الملف: application/pdf
اللغة: English
تدمد: 0304-3991
Relation: https://www.zora.uzh.ch/id/eprint/44523/13/Acc-MS_Steinwand.pdf; info:pmid/20462698; urn:issn:0304-3991
DOI: 10.1016/j.ultramic.2010.04.013
الاتاحة: https://www.zora.uzh.ch/id/eprint/44523/
https://doi.org/10.1016/j.ultramic.2010.04.013
Rights: info:eu-repo/semantics/openAccess
رقم الانضمام: edsbas.3395EEFC
قاعدة البيانات: BASE
الوصف
تدمد:03043991
DOI:10.1016/j.ultramic.2010.04.013