Academic Journal

Sub-10 nm feature chromium photomasks for contact lithography patterning of square metal ring arrays

التفاصيل البيبلوغرافية
العنوان: Sub-10 nm feature chromium photomasks for contact lithography patterning of square metal ring arrays
المؤلفون: Park, Woongkyu, Rhie, Jiyeah, Kim, Na Yeon, Hong, Seunghun, Kim, Dai-Sik
المصدر: Scientific Reports ; volume 6, issue 1 ; ISSN 2045-2322
بيانات النشر: Springer Science and Business Media LLC
سنة النشر: 2016
الوصف: Advances in photolithographic processes have allowed semiconductor industries to manufacture smaller and denser chips. As the feature size of integrated circuits becomes smaller, there has been a growing need for a photomask embedded with ever narrower patterns. However, it is challenging for electron beam lithography to obtain <10 nm linewidths with wafer scale uniformity and a necessary speed. Here, we introduce a photolithography-based, cost-effective mask fabrication method based on atomic layer deposition and overhang structures for sacrificial layers. Using this method, we obtained sub-10 nm square ring arrays of side length 50 μm, and periodicity 100 μm on chromium film, on 1 cm by 1 cm quartz substrate. These patterns were then used as a contact-lithography photomask using 365 nm I-line, to generate metal ring arrays on silicon substrate.
نوع الوثيقة: article in journal/newspaper
اللغة: English
DOI: 10.1038/srep23823
الاتاحة: http://dx.doi.org/10.1038/srep23823
https://www.nature.com/articles/srep23823.pdf
https://www.nature.com/articles/srep23823
Rights: https://creativecommons.org/licenses/by/4.0 ; https://creativecommons.org/licenses/by/4.0
رقم الانضمام: edsbas.32243875
قاعدة البيانات: BASE