Academic Journal
Coupling Electronic Holography and Finite-Element Method Simulations to Measure Electric Fields in Nanocapacitors.
| العنوان: | Coupling Electronic Holography and Finite-Element Method Simulations to Measure Electric Fields in Nanocapacitors. |
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| المؤلفون: | Gruel, Kilian, Serra, Raphaël, Zhang, Leifeng, Masseboeuf, Aurélien, Hÿtch, Martin J, Gatel, Christophe |
| المصدر: | Microscopy and Microanalysis ; volume 28, issue S1, page 2278-2280 ; ISSN 1435-8115 1431-9276 |
| بيانات النشر: | Oxford University Press (OUP) |
| سنة النشر: | 2022 |
| مصطلحات موضوعية: | Instrumentation |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | English |
| DOI: | 10.1017/s1431927622008753 |
| الاتاحة: | http://dx.doi.org/10.1017/s1431927622008753 https://academic.oup.com/mam/article-pdf/28/S1/2278/48822605/mam2278.pdf |
| Rights: | https://academic.oup.com/journals/pages/open_access/funder_policies/chorus/standard_publication_model ; https://www.cambridge.org/core/terms |
| رقم الانضمام: | edsbas.30685270 |
| قاعدة البيانات: | BASE |
| DOI: | 10.1017/s1431927622008753 |
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