Academic Journal

Determining Electronic and Thermal Properties of β-Ga2O3 Based Devices Using In Situ STEM Combined with Spectroscopic Methods

التفاصيل البيبلوغرافية
العنوان: Determining Electronic and Thermal Properties of β-Ga2O3 Based Devices Using In Situ STEM Combined with Spectroscopic Methods
المؤلفون: Chae, Christopher, Zhu, Menglin, Huang, Hsien-Lien, Islam, Minhazul, Hwang, Jinwoo
المصدر: Microscopy and Microanalysis ; volume 30, issue Supplement_1 ; ISSN 1431-9276 1435-8115
بيانات النشر: Oxford University Press (OUP)
سنة النشر: 2024
نوع الوثيقة: article in journal/newspaper
اللغة: English
DOI: 10.1093/mam/ozae044.068
الاتاحة: http://dx.doi.org/10.1093/mam/ozae044.068
https://academic.oup.com/mam/article-pdf/30/Supplement_1/ozae044.068/58670832/ozae044.068.pdf
Rights: https://academic.oup.com/pages/standard-publication-reuse-rights
رقم الانضمام: edsbas.2FE2DF08
قاعدة البيانات: BASE