Academic Journal
The isocurrent test: A promising tool for wafer-level evaluation of the interconnect reliability
| العنوان: | The isocurrent test: A promising tool for wafer-level evaluation of the interconnect reliability |
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| المؤلفون: | Witvrouw, A., van Dooren, S., Wouters, D., van Dievel, M., Maex, K. |
| المصدر: | Microelectronics Reliability ; volume 36, issue 11-12, page 1847-1850 ; ISSN 0026-2714 |
| بيانات النشر: | Elsevier BV |
| سنة النشر: | 1996 |
| المجموعة: | ScienceDirect (Elsevier - Open Access Articles via Crossref) |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | English |
| DOI: | 10.1016/0026-2714(96)00212-0 |
| الاتاحة: | http://dx.doi.org/10.1016/0026-2714(96)00212-0 https://api.elsevier.com/content/article/PII:0026271496002120?httpAccept=text/xml https://api.elsevier.com/content/article/PII:0026271496002120?httpAccept=text/plain |
| Rights: | https://www.elsevier.com/tdm/userlicense/1.0/ |
| رقم الانضمام: | edsbas.2E6A41E2 |
| قاعدة البيانات: | BASE |
| DOI: | 10.1016/0026-2714(96)00212-0 |
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