Academic Journal
Structural, optical, electrical and morphological properties of ZnTe films deposited by electron beam evaporation
| العنوان: | Structural, optical, electrical and morphological properties of ZnTe films deposited by electron beam evaporation |
|---|---|
| المؤلفون: | Ahamed, M.G.S.B., Nagarethinam, V.S., Thayumanavan, A., Murali, K.R., Sanjeeviraja, C., Jayachandran, M. |
| بيانات النشر: | Springer Science+Business Media, LLC |
| سنة النشر: | 2010 |
| المجموعة: | Central Electrochemical Research Institute, Karaikudi: IR@CECRI |
| مصطلحات موضوعية: | Electrochemical Materials Science |
| الوصف: | ZnTe films were deposited on glass substrates at different substrate temperatures in the range 30–300 �C. The thickness of the films was about 200 nm. The films exhibited cubic structure with preferential orientation in the (111) direction. Band gap values in the range 2.34–2.26 eV are observed with increase of the substrate temperature. The refractive index values are in the range of 2.55–2.92 for the films deposited at different substrate temperatures. It is observed that the conductivity increases continuously with temperature. Laser Raman studies indicated the presence of peaks at 206.9 and 412.2 cm-1corresponding to the first order and second order LO phonon. |
| نوع الوثيقة: | article in journal/newspaper |
| وصف الملف: | application/pdf |
| اللغة: | unknown |
| Relation: | http://cecri.csircentral.net/464/1/2010-093.pdf; Ahamed, M.G.S.B. and Nagarethinam, V.S. and Thayumanavan, A. and Murali, K.R. and Sanjeeviraja, C. and Jayachandran, M. (2010) Structural, optical, electrical and morphological properties of ZnTe films deposited by electron beam evaporation. Journal of Materials Science, 21. pp. 1229-1234. ISSN 0022-2461 |
| الاتاحة: | http://cecri.csircentral.net/464/ http://cecri.csircentral.net/464/1/2010-093.pdf |
| رقم الانضمام: | edsbas.2A8BFFAA |
| قاعدة البيانات: | BASE |
| الوصف غير متاح. |