Conference
Impact of Complex-Logic Cell Layout on the Single-Event Transient Sensitivity
| العنوان: | Impact of Complex-Logic Cell Layout on the Single-Event Transient Sensitivity |
|---|---|
| المؤلفون: | Quadros de Aguiar, Ygor, Wrobel, Frédéric, Autran, Jean-Luc, Leroux, Paul, Saigné, Frédéric, Touboul, Antoine, Pouget, Vincent |
| المساهمون: | Radiations et composants (RADIAC), Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), Catholic University of Leuven = Katholieke Universiteit Leuven (KU Leuven) |
| المصدر: | RADECS 2018 Proceedings ; IEEE RADECS2018 ; https://hal.science/hal-02086422 ; IEEE RADECS2018, Sep 2018, Goteborg, Sweden |
| بيانات النشر: | HAL CCSD |
| سنة النشر: | 2018 |
| المجموعة: | Université de Toulon: HAL |
| مصطلحات موضوعية: | Complex-logic gate, Heavy ions, Logical Masking, Monte-Carlo simulation, Single-Event Transient, [SPI.TRON]Engineering Sciences [physics]/Electronics |
| جغرافية الموضوع: | Goteborg, Sweden |
| الوصف: | International audience ; The design methodology based on standard cells is widely used in a broad range of VLSI applications. Further, several optimization algorithms can be employed to address different constraints such as power consumption or reliability. This work evaluates the implications of the usage of complex-logic cells from a 45 nm Standard-Cell library to the Single-Event Transient sensitivity under heavy ions. Results show that even though a reduction in the layout area is obtained when adopting complex-logic gates, a slight reduction in the total sensitive area of the circuit is observed. Moreover, the effectiveness of logical masking can be suppressed, leading to a higher SET cross-section. |
| نوع الوثيقة: | conference object |
| اللغة: | English |
| Relation: | hal-02086422; https://hal.science/hal-02086422; https://hal.science/hal-02086422/document; https://hal.science/hal-02086422/file/AGUIAR_RADECS2018_v1.pdf |
| الاتاحة: | https://hal.science/hal-02086422 https://hal.science/hal-02086422/document https://hal.science/hal-02086422/file/AGUIAR_RADECS2018_v1.pdf |
| Rights: | info:eu-repo/semantics/OpenAccess |
| رقم الانضمام: | edsbas.29C4EAF6 |
| قاعدة البيانات: | BASE |
| الوصف غير متاح. |