Academic Journal
Three-Dimensional Time-of-Flight Secondary Ion Mass Spectrometry and DualBeam FIB/SEM Imaging of Lithium-ion Battery Cathode
| العنوان: | Three-Dimensional Time-of-Flight Secondary Ion Mass Spectrometry and DualBeam FIB/SEM Imaging of Lithium-ion Battery Cathode |
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| المؤلفون: | Jiao, Chengge, Pillatsch, Lex, Mulders, Johannes, Wall, David |
| المصدر: | Microscopy and Microanalysis ; volume 25, issue S2, page 876-877 ; ISSN 1431-9276 1435-8115 |
| بيانات النشر: | Oxford University Press (OUP) |
| سنة النشر: | 2019 |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | English |
| DOI: | 10.1017/s1431927619005117 |
| الاتاحة: | https://doi.org/10.1017/s1431927619005117 https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927619005117 |
| Rights: | https://www.cambridge.org/core/terms |
| رقم الانضمام: | edsbas.2906A41B |
| قاعدة البيانات: | BASE |
| DOI: | 10.1017/s1431927619005117 |
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