Conference
Improved electrical characteristics and reliability of multi-stacking PNPN junctionless transistors using channel depletion effect
| العنوان: | Improved electrical characteristics and reliability of multi-stacking PNPN junctionless transistors using channel depletion effect |
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| المؤلفون: | Lin, Ming-Huei, Shih, Yi-Jia, Liu, Chien, Chiu, Yu-Chien, Fan, Chia-Chi, Liou, Guan-Lin, Cheng, Chun-Hu, Chang, Chun-Yen |
| المصدر: | 2017 Silicon Nanoelectronics Workshop (SNW) ; page 47-48 |
| بيانات النشر: | IEEE |
| سنة النشر: | 2017 |
| نوع الوثيقة: | conference object |
| اللغة: | unknown |
| DOI: | 10.23919/snw.2017.8242290 |
| الاتاحة: | http://dx.doi.org/10.23919/snw.2017.8242290 http://xplorestaging.ieee.org/ielx7/8231111/8242265/08242290.pdf?arnumber=8242290 |
| رقم الانضمام: | edsbas.286A5E4E |
| قاعدة البيانات: | BASE |
| DOI: | 10.23919/snw.2017.8242290 |
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