Academic Journal
Anisotropic complex refractive indices of atomically thin materials: Determination of the optical constants of few-layer black phosphorus
| العنوان: | Anisotropic complex refractive indices of atomically thin materials: Determination of the optical constants of few-layer black phosphorus |
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| المؤلفون: | Ross A. M., Paterno G. M., Dal Conte S., Scotognella F., Cinquanta E. |
| المساهمون: | Ross, A. M., Paterno, G. M., Dal Conte, S., Scotognella, F., Cinquanta, E. |
| بيانات النشر: | MDPI |
| سنة النشر: | 2020 |
| المجموعة: | PORTO@iris (Publications Open Repository TOrino - Politecnico di Torino) |
| مصطلحات موضوعية: | Black phosphoru, Complex refractive index, Kramers–Kronig analysi, Transition metal dichalcogenide, Two-dimensional materials |
| الوصف: | In this work, studies of the optical constants of monolayer transition metal dichalcogenides and few-layer black phosphorus are briefly reviewed, with particular emphasis on the complex dielectric function and refractive index. Specifically, an estimate of the complex index of refraction of phosphorene and few-layer black phosphorus is given. The complex index of refraction of this material was extracted from differential reflectance data reported in the literature by employing a constrained Kramers–Kronig analysis combined with the transfer matrix method. The reflectance contrast of 1–3 layers of black phosphorus on a silicon dioxide/silicon substrate was then calculated using the extracted complex indices of refraction. |
| نوع الوثيقة: | article in journal/newspaper |
| اللغة: | English |
| Relation: | info:eu-repo/semantics/altIdentifier/wos/WOS:000602900200001; volume:13; issue:24; firstpage:1; lastpage:12; numberofpages:12; journal:MATERIALS; https://hdl.handle.net/11583/2985630 |
| DOI: | 10.3390/ma13245736 |
| الاتاحة: | https://hdl.handle.net/11583/2985630 https://doi.org/10.3390/ma13245736 https://www.mdpi.com/1996-1944/13/24/5736 |
| Rights: | info:eu-repo/semantics/openAccess |
| رقم الانضمام: | edsbas.24B14E04 |
| قاعدة البيانات: | BASE |
| DOI: | 10.3390/ma13245736 |
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