Optical Power Screening Effects in Ge-on-Si Vertical Pin Photodetectors

التفاصيل البيبلوغرافية
العنوان: Optical Power Screening Effects in Ge-on-Si Vertical Pin Photodetectors
المؤلفون: Alasio, Matteo, Franco, Paolo, Tibaldi, Alberto, Bertazzi, Francesco, Namnabat, Soha, Adams, Donald, Gothoskar, Prakash, Masini, Gianlorenzo, Forghieri, Fabrizio, Ghione, Giovanni, Goano, Michele
المساهمون: Alasio, Matteo, Franco, Paolo, Tibaldi, Alberto, Bertazzi, Francesco, Namnabat, Soha, Adams, Donald, Gothoskar, Prakash, Masini, Gianlorenzo, Forghieri, Fabrizio, Ghione, Giovanni, Goano, Michele
بيانات النشر: Springer
سنة النشر: 2023
المجموعة: PORTO@iris (Publications Open Repository TOrino - Politecnico di Torino)
مصطلحات موضوعية: Silicon photonic, Device multiphysics modeling, Ge-on-Si waveguide photodetector, Waveguide photodetector, Germanium, 3D modeling
الوصف: We present an experimental and numerical study on the effects of the input optical power on the electro-optic frequency response of a Ge-on-Si vertical pin waveguide photodetector. Experimental results were provided by Cisco Systems, which characterized several nominally identical devices. Increasing the optical power from −2 dBm to 3 dBm, a significant decrease of the electro-optic frequency response was observed in the O-band, from about 40GHz down to approximately 32GHz. This trend is accurately predicted by our 3D multiphysics model, where Maxwell’s equations are solved with the FDTD method to evaluate the spatial distribution of photogenerated carriers, which is then converted in an optical generation rate included in the drift-diffusion solver. The 3D model provides a detailed explanation of the experiments by showing the effects of carrier screening on the magnitude of the electric field profile, which is reduced for high optical power, slowing the photogenerated carriers and reducing the bandwidth.
نوع الوثيقة: conference object
وصف الملف: STAMPA
اللغة: English
Relation: info:eu-repo/semantics/altIdentifier/isbn/978-3-031-26065-0; info:eu-repo/semantics/altIdentifier/isbn/978-3-031-26066-7; ispartofbook:Lecture Notes in Electrical Engineering; 53rd Annual Meeting of the Italian Electronics Society; volume:1005; firstpage:155; lastpage:159; numberofpages:5; serie:LECTURE NOTES IN ELECTRICAL ENGINEERING; https://hdl.handle.net/11583/2976613; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85149941611; https://link.springer.com/chapter/10.1007/978-3-031-26066-7_24
DOI: 10.1007/978-3-031-26066-7_24
الاتاحة: https://hdl.handle.net/11583/2976613
https://doi.org/10.1007/978-3-031-26066-7_24
https://link.springer.com/chapter/10.1007/978-3-031-26066-7_24
Rights: info:eu-repo/semantics/openAccess
رقم الانضمام: edsbas.1F6B4503
قاعدة البيانات: BASE
الوصف
DOI:10.1007/978-3-031-26066-7_24