Simulated Thick, Fully-Depleted CCD Exposures Analyzed with Deep Learning Techniques

التفاصيل البيبلوغرافية
العنوان: Simulated Thick, Fully-Depleted CCD Exposures Analyzed with Deep Learning Techniques
المؤلفون: Britt, C., Church, E., Hossbach, T., Loer, B., Saldanha, R., Sinha, N., Woodruff, K.
سنة النشر: 2022
المجموعة: Nuclear Experiment
Physics (Other)
مصطلحات موضوعية: Physics - Instrumentation and Detectors, Nuclear Experiment
الوصف: Thick, Charge Coupled Devices (CCDs) have recently been explored for applied physics, such as nuclear explosion monitoring, and dark matter detection purposes. When run in fully-depleted mode, these devices are sensitive detectors for energy depositions by a variety of primary particles. In this study we are interested in applying the Deep Learning (DL) technique known as panoptic segmentation to simulated CCD images to identify, attribute and measure energy depositions from radioisotopes of interest. We simulate CCD exposures of a chosen radioxenon isotope, $^{135}$Xe, and overlay a simulated cosmic muon background appropriate for a surface-lab. We show that with this DL technique we can reproduce the beta spectrum to good accuracy, while suffering expected confusion with same-topology gammas and conversion electrons and identifying cosmic muons less than optimally.
نوع الوثيقة: Working Paper
URL الوصول: http://arxiv.org/abs/2201.08973
رقم الانضمام: edsarx.2201.08973
قاعدة البيانات: arXiv