Report
Single-frame far-field diffractive imaging with randomized illumination
| العنوان: | Single-frame far-field diffractive imaging with randomized illumination |
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| المؤلفون: | Levitan, Abraham L., Keskinbora, Kahraman, Sanli, Umut T., Weigand, Markus, Comin, Riccardo |
| المصدر: | Optics Express 28 (2020) 37103-37117 |
| سنة النشر: | 2020 |
| المجموعة: | Condensed Matter Physics (Other) |
| مصطلحات موضوعية: | Physics - Optics, Condensed Matter - Materials Science, Electrical Engineering and Systems Science - Image and Video Processing |
| الوصف: | We introduce a single-frame diffractive imaging method called randomized probe imaging (RPI). In RPI, a sample is illuminated by a structured probe field containing speckles smaller than the sample's typical feature size. Quantitative amplitude and phase images are then reconstructed from the resulting far-field diffraction pattern. The experimental geometry of RPI is straightforward to implement, requires no near-field optics, and is applicable to extended samples. When the resulting data are analyzed with a complimentary algorithm, reliable reconstructions which are robust to missing data are achieved. To realize these benefits, a resolution limit associated with the numerical aperture of the probe-forming optics is imposed. RPI therefore offers an attractive modality for quantitative X-ray phase imaging when temporal resolution and reliability are critical but spatial resolution in the tens of nanometers is sufficient. We discuss the method, introduce a reconstruction algorithm, and present two proof-of-concept experiments: one using visible light, and one using soft X-rays. |
| نوع الوثيقة: | Working Paper |
| DOI: | 10.1364/OE.397421 |
| URL الوصول: | http://arxiv.org/abs/2010.02948 |
| رقم الانضمام: | edsarx.2010.02948 |
| قاعدة البيانات: | arXiv |
| DOI: | 10.1364/OE.397421 |
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