Report
High-resolution error detection in the capture process of a single-electron pump
| العنوان: | High-resolution error detection in the capture process of a single-electron pump |
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| المؤلفون: | Giblin, S. P., See, P., Petrie, A., Janssen, T. J. B. M., Farrer, I., Griffiths, J. P., Jones, G. A. C., Ritchie, D. A., Kataoka, M. |
| المصدر: | Applied Physics Letters vol. 108, 023502 (2016) |
| سنة النشر: | 2018 |
| المجموعة: | Condensed Matter |
| مصطلحات موضوعية: | Condensed Matter - Mesoscale and Nanoscale Physics |
| الوصف: | The dynamic capture of electrons in a semiconductor quantum dot (QD) by raising a potential barrier is a crucial stage in metrological quantized charge pumping. In this work, we use a quantum point contact (QPC) charge sensor to study errors in the electron capture process of a QD formed in a GaAs heterostructure. Using a two-step measurement protocol to compensate for $1/f$ noise in the QPC current, and repeating the protocol more than $10^{6}$ times, we are able to resolve errors with probabilities of order $10^{-6}$. For the studied sample, one-electron capture is affected by errors in $\sim30$ out of every million cycles, while two-electron capture was performed more than $10^6$ times with only one error. For errors in one-electron capture, we detect both failure to capture an electron, and capture of two electrons. Electron counting measurements are a valuable tool for investigating non-equilibrium charge capture dynamics, and necessary for validating the metrological accuracy of semiconductor electron pumps. Comment: 5 pages, 4 figures |
| نوع الوثيقة: | Working Paper |
| DOI: | 10.1063/1.4939250 |
| URL الوصول: | http://arxiv.org/abs/1809.10081 |
| رقم الانضمام: | edsarx.1809.10081 |
| قاعدة البيانات: | arXiv |
| DOI: | 10.1063/1.4939250 |
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