Scanning probe microscopy imaging of metallic nanocontacts

التفاصيل البيبلوغرافية
العنوان: Scanning probe microscopy imaging of metallic nanocontacts
المؤلفون: Stöffler, D., Fostner, S., Grütter, P., Hoffmann-Vogel, R.
المصدر: Physical Review B 85, 033404 (2012)
سنة النشر: 2011
المجموعة: Condensed Matter
مصطلحات موضوعية: Condensed Matter - Mesoscale and Nanoscale Physics, Condensed Matter - Materials Science
الوصف: We show scanning probe microscopy measurements of metallic nanocontacts between controlled electromigration cycles. The nanowires used for the thinning process are fabricated by shadow evaporation. The highest resolution obtained using scanning force microscopy is about 3 nm. During the first few electromigration cycles the overall slit structure of the nanocontact is formed. The slit first passes along grain boundaries and then at a later stage vertically splits grains in the course of consuming them. We find that first the whole wire is heated and later during the thinning process as the slit forms the current runs over several smaller contacts which needs less power.
Comment: 4 pages, 4 figures
نوع الوثيقة: Working Paper
DOI: 10.1103/PhysRevB.85.033404
URL الوصول: http://arxiv.org/abs/1112.6309
رقم الانضمام: edsarx.1112.6309
قاعدة البيانات: arXiv
الوصف
DOI:10.1103/PhysRevB.85.033404