Dirac Fermions in Graphene with Stacking Fault Induced Periodic Line Defects

التفاصيل البيبلوغرافية
العنوان: Dirac Fermions in Graphene with Stacking Fault Induced Periodic Line Defects
المؤلفون: Fangyang Zhan, Weixiang Kong, Jing Fan, Rui Wang, Xiaoliang Xiao, Juan Wei, Xiaozhi Wu, Li-Yong Gan
المصدر: The Journal of Physical Chemistry Letters. 12:10874-10879
بيانات النشر: American Chemical Society (ACS), 2021.
سنة النشر: 2021
مصطلحات موضوعية: Physics, Condensed matter physics, Graphene, Dirac (software), law.invention, Massless particle, Line defects, symbols.namesake, Dirac fermion, Nanoelectronics, law, symbols, General Materials Science, Physical and Theoretical Chemistry, Stacking fault, Electronic properties
الوصف: The exploration of carbon phases with intact massless Dirac fermions in the presence of defects is critical for practical applications to nanoelectronics. Here, we identify by first-principles calculations that the Dirac cones can exist in graphene with stacking fault (SF) induced periodic line defects. These structures are width (n)-dependent to graphene nanoribbon and are thus termed as (SF)n-graphene. The electronic properties reveal that the semimetallic features with Dirac cones occur in (SF)n-graphene with n = 3m + 1, where m is a positive integer, and then lead to a quasi-one-dimensional conducting channel. Importantly, it is found that the twisted Dirac cone in the (SF)4-graphene is tunable among type-I, type-II, and type-III through a small uniaxial strain. The further stability analysis shows that (SF)n-graphene is thermodynamic stable. Our findings provide an artificial avenue for exploring Dirac Ffermions in carbon-allotropic structures in the presence of defects.
تدمد: 1948-7185
DOI: 10.1021/acs.jpclett.1c02996
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f5cadd33140d4ab4db2dd13ae57b1376
https://doi.org/10.1021/acs.jpclett.1c02996
Rights: CLOSED
رقم الانضمام: edsair.doi.dedup.....f5cadd33140d4ab4db2dd13ae57b1376
قاعدة البيانات: OpenAIRE
الوصف
تدمد:19487185
DOI:10.1021/acs.jpclett.1c02996