Spectrally resolved x-ray beam induced current in a single InGaP nanowire
| العنوان: | Spectrally resolved x-ray beam induced current in a single InGaP nanowire |
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| المؤلفون: | Jesper Wallentin, Damien Salomon, Lert Chayanun, Vilgailė Dagytė, Andrea Troian, Magnus T. Borgström |
| المساهمون: | Department of Synchroton Radiation Research, University of Lund, European Synchrotron Radiation Facility (ESRF), Lund University [Lund] |
| المصدر: | Nanotechnology Nanotechnology, Institute of Physics, 2018, 29 (45), pp.454001-1-454001-5. ⟨10.1088/1361-6528/aadc76⟩ 'Nanotechnology ', vol: 29, pages: 454001-1-454001-5 (2018) |
| بيانات النشر: | HAL CCSD, 2018. |
| سنة النشر: | 2018 |
| مصطلحات موضوعية: | Materials science, [SDV]Life Sciences [q-bio], Nanowire, Bioengineering, x-ray beam induced current(XBIC), 02 engineering and technology, 01 natural sciences, 0103 physical sciences, General Materials Science, Electrical and Electronic Engineering, Absorption (electromagnetic radiation), Spectroscopy, NANOWIRE, 010302 applied physics, business.industry, Mechanical Engineering, Doping, General Chemistry, 021001 nanoscience & nanotechnology, X-ray absorption fine structure, EXAFS, Absorption edge, Mechanics of Materials, nanowire, Optoelectronics, 0210 nano-technology, business, Beam (structure), Excitation, x-ray absorptionfine structure spectroscopy(XAFS) |
| الوصف: | International audience; We demonstrate x-ray absorption fine structure spectroscopy (XAFS) detected by x-ray beam induced current (XBIC) in single n(+)i-n(+) doped nanowire devices. Spatial scans with the 65 nm diameter beam show a peak of the XBIC signal in the middle segment of the nanowire. The XBIC and the x-ray fluorescence signals were detected simultaneously as a function of the excitation energy near the Ga K absorption edge at 10.37 keV. The spectra show similar oscillations around the edge, which shows that the XBIC is limited by the primary absorption. Our results reveal the feasibility of the XBIC detection mode for the XAFS investigation in nanostructured devices. |
| وصف الملف: | application/pdf |
| اللغة: | English |
| تدمد: | 0957-4484 1361-6528 |
| DOI: | 10.1088/1361-6528/aadc76⟩ |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d45afba65ca3ac11c5fbc638c7ac8c99 https://hal.archives-ouvertes.fr/hal-02976410/file/Nanotechnology_29_454001.pdf |
| Rights: | OPEN |
| رقم الانضمام: | edsair.doi.dedup.....d45afba65ca3ac11c5fbc638c7ac8c99 |
| قاعدة البيانات: | OpenAIRE |
| تدمد: | 09574484 13616528 |
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| DOI: | 10.1088/1361-6528/aadc76⟩ |