Effect of the Incorporation of Titanium on the Optical Properties of ZnO Thin Films: From Doping to Mixed Oxide Formation

التفاصيل البيبلوغرافية
العنوان: Effect of the Incorporation of Titanium on the Optical Properties of ZnO Thin Films: From Doping to Mixed Oxide Formation
المؤلفون: Olga Sánchez, Miriam Yuste, Ramón Escobar-Galindo, Oscar Martinez, Carlos Palacio, Noelia Benito, J. M. Albella
المساهمون: Consejo Superior de Investigaciones Científicas (España), Comunidad de Madrid, Ministerio de Economía y Competitividad (España), Ciencia de los Materiales e Ingeniería Metalúrgica y Química Inorgánica, Universidad de Sevilla. Departamento de Física Aplicada I, Universidad de Sevilla. TEP-946 Materiales y Nanotecnología para la Innovación
المصدر: Digital.CSIC. Repositorio Institucional del CSIC
instname
Coatings
Volume 9
Issue 3
Coatings 2019, 9, 180
RODIN. Repositorio de Objetos de Docencia e Investigación de la Universidad de Cádiz
idUS. Depósito de Investigación de la Universidad de Sevilla
Coatings, Vol 9, Iss 3, p 180 (2019)
UVaDOC. Repositorio Documental de la Universidad de Valladolid
بيانات النشر: MDPI AG, 2018.
سنة النشر: 2018
مصطلحات موضوعية: Materials science, Photoluminescence, Absorption spectroscopy, Analytical chemistry, chemistry.chemical_element, UV-visible, Crystallinity, X-ray photoelectron spectroscopy, Materials Chemistry, 22 Física, Thin film, Doping, Ti doped ZnO, Surfaces and Interfaces, Mixed oxide formation, Surfaces, Coatings and Films, Amorphous solid, co-sputtering, Co-sputtering, surfaces,_coatings_films, chemistry, lcsh:TA1-2040, Mixed oxide, lcsh:Engineering (General). Civil engineering (General), 33 Ciencias Tecnológicas, Titanium
الوصف: ZnO films with Ti atoms incorporated (TZO) in a wide range (0&ndash
18 at.%) have been grown by reactive co-sputtering on silicon and glass substrates. The influence of the titanium incorporation in the ZnO matrix on the structural and optical characteristics of the samples has been determined by Rutherford backscattering spectroscopy (RBS), X-ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD). The results indicate that the samples with low Ti content (<
4 at.%) exhibit a wurtzite-like structure, with the Ti4+ ions substitutionally incorporated into the ZnO structure, forming Ti-doped ZnO films. In particular, a very low concentration of Ti (<
0.9 at.%) leads to a significant increase of the crystallinity of the TZO samples. Higher Ti contents give rise to a progressive amorphization of the wurtzite-like structure, so samples with high Ti content (&ge
18 at.%) display an amorphous structure, indicating in the XPS analysis, a predominance of Ti&ndash
O&ndash
Zn mixed oxides. The energy gap obtained from absorption spectrophotometry increases from 3.2 eV for pure ZnO films to 3.6 eV for those with the highest Ti content. Ti incorporation in the ZnO samples <
0.9 at.% raises both the blue (380 nm) and green (approx. 550 nm) bands of the photoluminescence (PL) emission, thereby indicating a significant improvement of the PL efficiency of the samples.
وصف الملف: application/pdf
DOI: 10.20944/preprints201812.0298.v1
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::aa114d786b501f27305e4e06e612b646
https://doi.org/10.20944/preprints201812.0298.v1
Rights: OPEN
رقم الانضمام: edsair.doi.dedup.....aa114d786b501f27305e4e06e612b646
قاعدة البيانات: OpenAIRE
الوصف
DOI:10.20944/preprints201812.0298.v1