Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy

التفاصيل البيبلوغرافية
العنوان: Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy
المؤلفون: Peter D. Nellist, Annick De Backer, Sandra Van Aert, Lewys Jones, Armand Béché, Gerardo T. Martinez
المصدر: Physical Review Letters
Physical review letters
سنة النشر: 2019
مصطلحات موضوعية: Nanostructure, Materials science, business.industry, Physics, General Physics and Astronomy, Electron, 01 natural sciences, Atomic units, Dark field microscopy, 0103 physical sciences, Atom, Scanning transmission electron microscopy, Optoelectronics, Sensitivity (control systems), 010306 general physics, business, Beam (structure)
الوصف: Understanding nanostructures down to the atomic level is the key to optimizing the design of advanced materials with revolutionary novel properties. This requires characterization methods capable of quantifying the three-dimensional (3D) atomic structure with the highest possible precision. A successful approach to reach this goal is to count the number of atoms in each atomic column from 2D annular dark field scanning transmission electron microscopy images. To count atoms with single atom sensitivity, a minimum electron dose has been shown to be necessary, while on the other hand beam damage, induced by the high energy electrons, puts a limit on the tolerable dose. An important challenge is therefore to develop experimental strategies to optimize the electron dose by balancing atom-counting fidelity vs the risk of knock-on damage. To achieve this goal, a statistical framework combined with physics-based modeling of the dose-dependent processes is here proposed and experimentally verified. This model enables an investigator to theoretically predict, in advance of an experimental measurement, the optimal electron dose resulting in an unambiguous quantification of nanostructures in their native state with the highest attainable precision.
وصف الملف: pdf
تدمد: 0031-9007
DOI: 10.1103/PHYSREVLETT.122.066101
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::77f396fc3ffdac9c8ee5c24138fd63a3
Rights: OPEN
رقم الانضمام: edsair.doi.dedup.....77f396fc3ffdac9c8ee5c24138fd63a3
قاعدة البيانات: OpenAIRE
الوصف
تدمد:00319007
DOI:10.1103/PHYSREVLETT.122.066101