Rare earth focused ion beam implantation utilizing Er and Pr liquid alloy ion sources

التفاصيل البيبلوغرافية
العنوان: Rare earth focused ion beam implantation utilizing Er and Pr liquid alloy ion sources
المؤلفون: Andrew J. Steckl, J. Cheng, Boon Kwee Lee, C. J. Chi, Irving Chyr, L. C. Chao
المصدر: Scopus-Elsevier
بيانات النشر: American Vacuum Society, 1999.
سنة النشر: 1999
مصطلحات موضوعية: Materials science, Ion beam, Ion beam mixing, General Engineering, Analytical chemistry, chemistry.chemical_element, Focused ion beam, Ion, Erbium, chemistry.chemical_compound, Ion implantation, Ion beam deposition, chemistry, ZBLAN
الوصف: We have developed procedures for the fabrication of Er–Ni and Pr–Pt liquid alloy ion sources (LAIS). Er2+beam with target current of ∼100 pA and Pr2+ beams with target current of ∼200 pA were obtained, which correspond to 50% and 80% of the total target current, respectively. Both Er–Ni and Pr–Pt alloys oxidize quickly once exposed to air. Er–Ni source lifetimes were generally larger than 200 μA h. The source lifetimes of Pr–Pt LAISs were approximately 30 μA h, limited by oxide contamination and wettability problems. Visible photoluminescence has been observed from Er- or Pr-doped GaN, Al2O3, and ZBLAN glass using focused ion beam direct write implantation.
تدمد: 0734-211X
DOI: 10.1116/1.591067
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6546a25075143348a83d8d194ad04b1b
https://doi.org/10.1116/1.591067
رقم الانضمام: edsair.doi.dedup.....6546a25075143348a83d8d194ad04b1b
قاعدة البيانات: OpenAIRE
الوصف
تدمد:0734211X
DOI:10.1116/1.591067