Evaluation of Diels–Alder poly(phenylene) anion exchange membranes in all-vanadium redox flow batteries

التفاصيل البيبلوغرافية
العنوان: Evaluation of Diels–Alder poly(phenylene) anion exchange membranes in all-vanadium redox flow batteries
المؤلفون: Thomas A. Zawodzinski, Cy Fujimoto, Che-Nan Sun, Cami Belcher, Zhijiang Tang
المصدر: Electrochemistry Communications, Vol 43, Iss, Pp 63-66 (2014)
بيانات النشر: Elsevier BV, 2014.
سنة النشر: 2014
مصطلحات موضوعية: Ion exchange, Inorganic chemistry, Vanadium, chemistry.chemical_element, Permeation, Flow battery, Redox, lcsh:Chemistry, chemistry.chemical_compound, Membrane, lcsh:Industrial electrochemistry, lcsh:QD1-999, chemistry, Phenylene, Nafion, Electrochemistry, lcsh:TP250-261
الوصف: Quaternary ammonium functionalized Diels–Alder poly(phenylene)s (QDAPPs) with different ion exchange capacities (IECs) are examined as membranes in all-vanadium redox flow batteries. QDAPP membrane behavior is compared to a standard, Nafion 212, in measurements of cycling efficiencies, areal specific resistance (ASR), vanadium permeation and durability. The IEC of the QDAPPs clearly shows an impact on the cell ASR and vanadium crossover. The results imply a trade-off between performance, indicated by cell voltage loss at a given current density, and rate of cross-over driven capacity loss in the system. Among the membranes studied, QDAPP with moderate IEC represents the best trade-off of these factors and exhibits higher performance and lower capacity loss compared to Nafion 212. All QDAPP membranes are found to be more durable than the analogous cation exchange membrane, sulfonated DAPP (SDAPP), in V5+ solution. Keywords: Flow battery, Vanadium, Membrane
تدمد: 1388-2481
DOI: 10.1016/j.elecom.2014.03.010
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::56859c0dc3686f8780ed730d77e0a4e4
https://doi.org/10.1016/j.elecom.2014.03.010
Rights: OPEN
رقم الانضمام: edsair.doi.dedup.....56859c0dc3686f8780ed730d77e0a4e4
قاعدة البيانات: OpenAIRE
الوصف
تدمد:13882481
DOI:10.1016/j.elecom.2014.03.010