Localized Magnetic Fields in Arbitrary Directions Using Patterned Nanomagnets

التفاصيل البيبلوغرافية
العنوان: Localized Magnetic Fields in Arbitrary Directions Using Patterned Nanomagnets
المؤلفون: McNeil, R. P. G., Schneble, R. J., Kataoka, M., Ford, C. J. B., Kasama, T., Dunin-Borkowski, R. E., Feinberg, J. M., Harrison, R. J., Barnes, C. H. W., Tse, D. H. Y., Trypiniotis, Theodossis, Bland, J. A. C., Anderson, D., Jones, G. A. C., Pepper, M.
المصدر: Nano Letters
Nano Lett.
بيانات النشر: American Chemical Society (ACS), 2010.
سنة النشر: 2010
مصطلحات موضوعية: Permalloy, Electric fields, Materials science, Field (physics), Arbitrary direction, Submicrometers, Quantum Dot, Bioengineering, Magnetic-field direction, Electron holography, Field orientation, Quantum information technologies, Magnetics, Electromagnetic Fields, equipment design, electromagnetic field, Electric field, Nanotechnology, Magnetic elements, General Materials Science, Nanomagnetics, Nano-meter scale, Quantum information, Magnetic materials, instrumentation, Nanomagnet, Quantum optics, nanotechnology, Nanomagnets, Condensed matter physics, Spintronics, Mechanical Engineering, article, Equipment Design, General Chemistry, Condensed Matter Physics, Existing method, Local fields, Magnetic field, Equipment Failure Analysis, Magnetic fields, magnetism, equipment, Local magnetic field
الوصف: Control of the local magnetic fields desirable for spintronics and quantum information technology is not well developed. Existing methods produce either moderately small local fields or one field orientation. We present designs of patterned magnetic elements that produce remanent fields of 50 mT (potentially 200 mT) confined to chosen, submicrometer regions in directions perpendicular to an external initializing field. A wide variety of magnetic-field profiles on nanometer scales can be produced with the option of applying electric fields, for example, to move a quantum dot between regions where the magnetic-field direction or strength is different. We have confirmed our modeling by measuring the fields in one design using electron holography. © 2010 American Chemical Society. 10 5 1549 1553 Cited By :14
تدمد: 1530-6992
1530-6984
DOI: 10.1021/nl902949v
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::318b405da1732c46a84991519867ef4c
https://doi.org/10.1021/nl902949v
Rights: OPEN
رقم الانضمام: edsair.doi.dedup.....318b405da1732c46a84991519867ef4c
قاعدة البيانات: OpenAIRE
الوصف
تدمد:15306992
15306984
DOI:10.1021/nl902949v