التفاصيل البيبلوغرافية
| العنوان: |
Spot profile analysis and lifetime mapping in ultrafast electron diffraction : lattice excitation of self-organized Ge nanostructures on Si(001) |
| المؤلفون: |
B. Hafke, T. Frigge, M. Horn-von Hoegen, T. Witte, V Tinnemann |
| المصدر: |
Structural Dynamics
Structural Dynamics, Vol 2, Iss 3, Pp 035101-035101-10 (2015) |
| سنة النشر: |
2015 |
| مصطلحات موضوعية: |
Diffraction, Materials science, Ultrafast electron diffraction, Surface diffraction, Domes, chemistry.chemical_element, Physics::Optics, Germanium, Pixels, Molecular physics, law.invention, ARTICLES, Electron diffraction, Time constants, law, lcsh:QD901-999, Instrumentation, Spectroscopy, Radiation, Laser excitation, Reflection geometry, Surfaces and Interfaces, Physik (inkl. Astronomie), Condensed Matter Physics, Laser, Cooling time constants, Crystallography, Ge nanostructures, chemistry, Lifetime mapping, Femtosecond, Structural dynamics, lcsh:Crystallography, Ultrashort pulse, Excitation, Spot profile analysis |
| الوصف: |
Ultrafast high energy electron diffraction in reflection geometry is employed to study the structural dynamics of self-organized Germanium hut-, dome-, and relaxed clusters on Si(001) upon femtosecond laser excitation. Utilizing the difference in size and strain state the response of hut- and dome clusters can be distinguished by a transient spot profile analysis. Surface diffraction from {105}-type facets provide exclusive information on hut clusters. A pixel-by-pixel analysis of the dynamics of the entire diffraction pattern gives time constants of 40, 160, and 390 ps, which are assigned to the cooling time constants for hut-, dome-, and relaxed clusters. |
| اللغة: |
English |
| URL الوصول: |
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2366dd6e768bf1d7e11107a10c3c7ace |
| Rights: |
OPEN |
| رقم الانضمام: |
edsair.doi.dedup.....2366dd6e768bf1d7e11107a10c3c7ace |
| قاعدة البيانات: |
OpenAIRE |