Crystal Structure of Oxygen/Nitrogen-Doped GeSbTe Phase-Change Media: Investigation Using Grazing Incidence X-ray Diffraction
| العنوان: | Crystal Structure of Oxygen/Nitrogen-Doped GeSbTe Phase-Change Media: Investigation Using Grazing Incidence X-ray Diffraction |
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| المؤلفون: | Aya Takase, Atsushi Ebina, Ikuto Sugiyama, Masao Hirasaka, Go Fujinawa |
| المصدر: | Japanese Journal of Applied Physics. 41:2189-2190 |
| بيانات النشر: | IOP Publishing, 2002. |
| سنة النشر: | 2002 |
| مصطلحات موضوعية: | Diffraction, Materials science, Physics and Astronomy (miscellaneous), Resolution (electron density), General Engineering, Analytical chemistry, Physics::Optics, General Physics and Astronomy, Crystal structure, GeSbTe, Condensed Matter::Materials Science, chemistry.chemical_compound, Crystallography, Lattice constant, chemistry, Condensed Matter::Superconductivity, X-ray crystallography, sense organs, Crystallite, Thin film |
| الوصف: | The effects of oxygen- and nitrogen-dopings on the crystal structure of GeSbTe recording layers of phase-change media were studied by X-ray diffraction. A high resolution grazing incidence X-ray diffraction optics using a laboratory X-ray source was developed to quantitatively analyze the crystal structure of thin film materials. Lattice parameter, crystallite size, and lattice strain were determined from diffraction profiles. |
| تدمد: | 1347-4065 0021-4922 |
| DOI: | 10.1143/jjap.41.2189 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::fe1a9f1baec2cf17dc95a72cd22580a6 https://doi.org/10.1143/jjap.41.2189 |
| رقم الانضمام: | edsair.doi...........fe1a9f1baec2cf17dc95a72cd22580a6 |
| قاعدة البيانات: | OpenAIRE |
| تدمد: | 13474065 00214922 |
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| DOI: | 10.1143/jjap.41.2189 |