This work presents a new technique named Raman strain rosette for the micro-strain measurement of both Raman active and Raman inactive materials. The technique is based on the theoretical model of the carbon nanotube (CNT) strain sensor that applies the resonance and polarization Raman properties of CNTs and calculates the synthetic contributions of uniformly dispersed CNTs to the entire Raman spectrum. In our work, the proposed technique is applied in different experiments on the Raman inactive materials, such as step-by-step uniaxial tensile and Raman mapping around a circular hole. The experimental results reached by the Raman strain rosette are consistent with the actual values as a whole. This study verifies that the Raman strain rosette is applicable to quantitative measurement of all the in-plane components of the strain tensor (including both normalandshearstrains)bythreepolarizedRamandetectionsforeachsamplingspotonamicroscale.Thetechniqueisfurther applicable to achieving the strainfields through Raman mapping. Copyright c � 2010 John Wiley & Sons, Ltd.