Microfabrication of a mechanically controllable break junction in silicon

التفاصيل البيبلوغرافية
العنوان: Microfabrication of a mechanically controllable break junction in silicon
المؤلفون: J. W. Sleight, Mark A. Reed, Chongwu Zhou, C. J. Muller, M. R. Deshpande
المصدر: Applied Physics Letters. 67:1160-1162
بيانات النشر: AIP Publishing, 1995.
سنة النشر: 1995
مصطلحات موضوعية: Fabrication, Materials science, Physics and Astronomy (miscellaneous), business.industry, Nanotechnology, Thermal conduction, Surface micromachining, Transducer, Optoelectronics, Electric current, business, Break junction, Quantum tunnelling, Microfabrication
الوصف: We present a detailed description of the fabrication and operation at room temperature of a novel type of tunnel displacement transducer. Instead of a feedback system it relies on a large reduction factor assuring an inherently stable device. Stability measurements in the tunnel regime infer an electrode stability within 3 pm in a 1 kHz bandwidth. In the contact regime the conductance takes on a discrete number of values when the constriction is reduced atom by atom. This reflects the conduction through discrete channels.
تدمد: 1077-3118
0003-6951
DOI: 10.1063/1.114994
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e794f777b62a91a89cca6cdc78388c56
https://doi.org/10.1063/1.114994
رقم الانضمام: edsair.doi...........e794f777b62a91a89cca6cdc78388c56
قاعدة البيانات: OpenAIRE
الوصف
تدمد:10773118
00036951
DOI:10.1063/1.114994