Package mTEXO for testing the presence of outliers in exponential samples

التفاصيل البيبلوغرافية
العنوان: Package mTEXO for testing the presence of outliers in exponential samples
المؤلفون: Narayanaswamy Balakrishnan, Ying-Chen Lee, Chien-Tai Lin
المصدر: Computational Statistics. 34:803-818
بيانات النشر: Springer Science and Business Media LLC, 2018.
سنة النشر: 2018
مصطلحات موضوعية: Statistics and Probability, 05 social sciences, 01 natural sciences, Exponential function, 010104 statistics & probability, Computational Mathematics, 0502 economics and business, Outlier, Applied mathematics, 0101 mathematics, Statistics, Probability and Uncertainty, Algebra over a field, 050205 econometrics, Mathematics, Statistical hypothesis testing
الوصف: We develop an user-interface package mTEXO in the Maplet application for testing exponential upper and/or lower outliers. The distributions of some well-known test statistics for exponential outliers in the literature can be easily evaluated using mTEXO, saving considerable computational time performing numerical integrations and combinatorial algebra necessary in the traditional approach.
تدمد: 1613-9658
0943-4062
DOI: 10.1007/s00180-018-0843-6
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c21c8c05a10d1151d8f2f317b7074606
https://doi.org/10.1007/s00180-018-0843-6
Rights: CLOSED
رقم الانضمام: edsair.doi...........c21c8c05a10d1151d8f2f317b7074606
قاعدة البيانات: OpenAIRE
الوصف
تدمد:16139658
09434062
DOI:10.1007/s00180-018-0843-6