Package mTEXO for testing the presence of outliers in exponential samples
العنوان: | Package mTEXO for testing the presence of outliers in exponential samples |
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المؤلفون: | Narayanaswamy Balakrishnan, Ying-Chen Lee, Chien-Tai Lin |
المصدر: | Computational Statistics. 34:803-818 |
بيانات النشر: | Springer Science and Business Media LLC, 2018. |
سنة النشر: | 2018 |
مصطلحات موضوعية: | Statistics and Probability, 05 social sciences, 01 natural sciences, Exponential function, 010104 statistics & probability, Computational Mathematics, 0502 economics and business, Outlier, Applied mathematics, 0101 mathematics, Statistics, Probability and Uncertainty, Algebra over a field, 050205 econometrics, Mathematics, Statistical hypothesis testing |
الوصف: | We develop an user-interface package mTEXO in the Maplet application for testing exponential upper and/or lower outliers. The distributions of some well-known test statistics for exponential outliers in the literature can be easily evaluated using mTEXO, saving considerable computational time performing numerical integrations and combinatorial algebra necessary in the traditional approach. |
تدمد: | 1613-9658 0943-4062 |
DOI: | 10.1007/s00180-018-0843-6 |
URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::c21c8c05a10d1151d8f2f317b7074606 https://doi.org/10.1007/s00180-018-0843-6 |
Rights: | CLOSED |
رقم الانضمام: | edsair.doi...........c21c8c05a10d1151d8f2f317b7074606 |
قاعدة البيانات: | OpenAIRE |
تدمد: | 16139658 09434062 |
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DOI: | 10.1007/s00180-018-0843-6 |