Characterization of Transparent Conducting Oxides
| العنوان: | Characterization of Transparent Conducting Oxides |
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| المؤلفون: | Xiaonan Li, David L. Young, Timothy J. Coutts |
| المصدر: | MRS Bulletin. 25:58-65 |
| بيانات النشر: | Springer Science and Business Media LLC, 2000. |
| سنة النشر: | 2000 |
| مصطلحات موضوعية: | Materials science, Absorptance, Energy materials, New materials, General Materials Science, Physical and Theoretical Chemistry, Condensed Matter Physics, Engineering physics, Sheet resistance, Present generation, Characterization (materials science) |
| الوصف: | As the areas of the major applications of transparent conducting oxides (TCOs) increase, demand will grow for materials having lower sheet resistance while retaining good optical properties. Simply increasing the film thickness is not acceptable because this would increase the optical absorptance. New materials must be developed with lower resistivities than previously achieved and with optical properties superior to those of the present generation of TCOs. This has now been recognized internationally, and novel materials are being investigated in Japan and the United States. |
| تدمد: | 1938-1425 0883-7694 |
| DOI: | 10.1557/mrs2000.152 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::c05cdfb456ea6b927e25933cadb37b03 https://doi.org/10.1557/mrs2000.152 |
| Rights: | CLOSED |
| رقم الانضمام: | edsair.doi...........c05cdfb456ea6b927e25933cadb37b03 |
| قاعدة البيانات: | OpenAIRE |
| تدمد: | 19381425 08837694 |
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| DOI: | 10.1557/mrs2000.152 |