Imaging beyond the diffraction limit via dark states

التفاصيل البيبلوغرافية
العنوان: Imaging beyond the diffraction limit via dark states
المؤلفون: M. Suhail Zubairy, Yuri V. Rostovtsev, Alexei V. Sokolov, Marlan O. Scully, George R. Welch, Vladimir A. Sautenkov, Hebil Li, Michael M. Kash
المصدر: Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing.
بيانات النشر: OSA, 2008.
سنة النشر: 2008
مصطلحات موضوعية: Physics, Quantum optics, Diffraction, business.industry, Near-field optics, Physics::Optics, Nonlinear optics, Physical optics, Molecular physics, Optics, Attenuation coefficient, Limit (mathematics), Crystal optics, business
الوصف: We study the possibility of creating spatial patterns smaller than the diffraction limit using the so-called dark states formed by the interaction between atoms and optical fields.
DOI: 10.1364/fio.2008.ftho4
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bc1ee016892e07f3065a7ec22b188151
https://doi.org/10.1364/fio.2008.ftho4
رقم الانضمام: edsair.doi...........bc1ee016892e07f3065a7ec22b188151
قاعدة البيانات: OpenAIRE