3D-AFM Measurements for Semiconductor Structures and Devices
| العنوان: | 3D-AFM Measurements for Semiconductor Structures and Devices |
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| المؤلفون: | David G. Seiler, Zhiyong Ma |
| بيانات النشر: | Jenny Stanford Publishing, 2017. |
| سنة النشر: | 2017 |
| مصطلحات موضوعية: | Semiconductor, Materials science, Atomic force microscopy, business.industry, Optoelectronics, business |
| DOI: | 10.1201/9781315185385-11 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::b7f023158ed8bcf9f862329939bb22d4 https://doi.org/10.1201/9781315185385-11 |
| رقم الانضمام: | edsair.doi...........b7f023158ed8bcf9f862329939bb22d4 |
| قاعدة البيانات: | OpenAIRE |
| DOI: | 10.1201/9781315185385-11 |
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