Optical properties of () thin films

التفاصيل البيبلوغرافية
العنوان: Optical properties of () thin films
المؤلفون: H. Schröter, D. Zur, J. Schoenes, M. Rode, A. Borgschulte
المصدر: Journal of Alloys and Compounds. :453-456
بيانات النشر: Elsevier BV, 2005.
سنة النشر: 2005
مصطلحات موضوعية: Hydrogen, Infrared, Mechanical Engineering, Metals and Alloys, Analytical chemistry, chemistry.chemical_element, Chemical vapor deposition, Crystal structure, Photon energy, Crystallography, chemistry, Mechanics of Materials, Materials Chemistry, Thin film, Absorption (electromagnetic radiation), Molecular beam epitaxy
الوصف: Thin single-crystalline films of YH x have been prepared by molecular beam epitaxy in a hydrogen atmosphere, thus avoiding the usual Pd capping layer. Near-normal incidence reflectivity and ellipticity measurements have been performed in the photon energy range from 1.2 meV to 5 eV and 1 to 10 eV, respectively. With increasing H concentration but x ≤ 2 , the absorption decreases below 2 eV and stronger structures develop above 2 eV. For x > 2 , an additional peak is found in the infrared showing a pronounced x and temperature (4 K ≤ T ≤ 295 K) dependence. Its behavior is discussed in terms of an order–disorder transition of hydrogen atoms.
تدمد: 0925-8388
DOI: 10.1016/j.jallcom.2004.10.081
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b62b7f77ede7b437fc5af98392aa4840
https://doi.org/10.1016/j.jallcom.2004.10.081
Rights: CLOSED
رقم الانضمام: edsair.doi...........b62b7f77ede7b437fc5af98392aa4840
قاعدة البيانات: OpenAIRE
الوصف
تدمد:09258388
DOI:10.1016/j.jallcom.2004.10.081