التفاصيل البيبلوغرافية
| العنوان: |
Hot Carrier Effect on RF Characteristics of High-k/Metal Gate SiGe Channel pMOSFETs |
| المؤلفون: |
Yoon-Ha Jeong, Hyun Chul Sagong, Js Lee, D. Y. Choi, C. Y. Kang, Eui-Young Jeong, C. W. Sohn |
| المصدر: |
Extended Abstracts of the 2011 International Conference on Solid State Devices and Materials. |
| بيانات النشر: |
The Japan Society of Applied Physics, 2011. |
| سنة النشر: |
2011 |
| مصطلحات موضوعية: |
Materials science, business.industry, Optoelectronics, Channel (broadcasting), business, High-κ dielectric, Hot carrier effect |
| DOI: |
10.7567/ssdm.2011.p-6-1 |
| URL الوصول: |
https://explore.openaire.eu/search/publication?articleId=doi_________::b33c1b7f9f2d116e2797a20050f69eab
https://doi.org/10.7567/ssdm.2011.p-6-1 |
| رقم الانضمام: |
edsair.doi...........b33c1b7f9f2d116e2797a20050f69eab |
| قاعدة البيانات: |
OpenAIRE |