Low‐temperature ultrahigh‐vacuum scanning tunneling microscope

التفاصيل البيبلوغرافية
العنوان: Low‐temperature ultrahigh‐vacuum scanning tunneling microscope
المؤلفون: C. F. Quate, M. M. Dovek, C. A. Lang
المصدر: Review of Scientific Instruments. 60:3109-3112
بيانات النشر: AIP Publishing, 1989.
سنة النشر: 1989
مصطلحات موضوعية: Materials science, business.industry, law.invention, Optics, Stack (abstract data type), law, Vacuum chamber, Work function, Graphite, Electron microscope, Scanning tunneling microscope, Spectroscopy, business, Instrumentation, Lithography
الوصف: We describe a multipurpose scanning tunneling microscope designed to operate in ultrahigh vacuum as well as in air, over a range extending from room temperature to liquid‐nitrogen temperatures. It is a single‐tube scanner design with a differential flexing approach mechanism mounted on a vibration isolation stack. The instrument features a novel in situ tip and sample exchange mechanism for extended operation under vacuum. A unique characteristic is that the vacuum chamber and all components with the exception of the gas‐cooled sample holder are at room temperature. We present preliminary data taken with this instrument, demonstrating atomic resolution constant current, constant height, and multiple‐bias imaging, gap‐modulated current‐voltage spectroscopy or simultaneous topography, and work function measurements, as well as lithography on the surfaces of graphite, Au(111) on mica, and GaAs(110).
تدمد: 1089-7623
0034-6748
DOI: 10.1063/1.1140586
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a04f9bb0895539bbdb0e19d949c42007
https://doi.org/10.1063/1.1140586
رقم الانضمام: edsair.doi...........a04f9bb0895539bbdb0e19d949c42007
قاعدة البيانات: OpenAIRE
الوصف
تدمد:10897623
00346748
DOI:10.1063/1.1140586