Low‐temperature ultrahigh‐vacuum scanning tunneling microscope
العنوان: | Low‐temperature ultrahigh‐vacuum scanning tunneling microscope |
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المؤلفون: | C. F. Quate, M. M. Dovek, C. A. Lang |
المصدر: | Review of Scientific Instruments. 60:3109-3112 |
بيانات النشر: | AIP Publishing, 1989. |
سنة النشر: | 1989 |
مصطلحات موضوعية: | Materials science, business.industry, law.invention, Optics, Stack (abstract data type), law, Vacuum chamber, Work function, Graphite, Electron microscope, Scanning tunneling microscope, Spectroscopy, business, Instrumentation, Lithography |
الوصف: | We describe a multipurpose scanning tunneling microscope designed to operate in ultrahigh vacuum as well as in air, over a range extending from room temperature to liquid‐nitrogen temperatures. It is a single‐tube scanner design with a differential flexing approach mechanism mounted on a vibration isolation stack. The instrument features a novel in situ tip and sample exchange mechanism for extended operation under vacuum. A unique characteristic is that the vacuum chamber and all components with the exception of the gas‐cooled sample holder are at room temperature. We present preliminary data taken with this instrument, demonstrating atomic resolution constant current, constant height, and multiple‐bias imaging, gap‐modulated current‐voltage spectroscopy or simultaneous topography, and work function measurements, as well as lithography on the surfaces of graphite, Au(111) on mica, and GaAs(110). |
تدمد: | 1089-7623 0034-6748 |
DOI: | 10.1063/1.1140586 |
URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::a04f9bb0895539bbdb0e19d949c42007 https://doi.org/10.1063/1.1140586 |
رقم الانضمام: | edsair.doi...........a04f9bb0895539bbdb0e19d949c42007 |
قاعدة البيانات: | OpenAIRE |
تدمد: | 10897623 00346748 |
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DOI: | 10.1063/1.1140586 |