A Scanning Probe Microscopy Study of Cd1−x Zn x Te
| العنوان: | A Scanning Probe Microscopy Study of Cd1−x Zn x Te |
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| المؤلفون: | Z. Klusek, Andy Brinkman, P. Dabrowski, C. K. Egan |
| المصدر: | Journal of Electronic Materials. 38:1528-1532 |
| بيانات النشر: | Springer Science and Business Media LLC, 2009. |
| سنة النشر: | 2009 |
| مصطلحات موضوعية: | Local density of states, Annealing (metallurgy), business.industry, Chemistry, Scanning tunneling spectroscopy, Polishing, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, law.invention, Scanning probe microscopy, Optics, Lapping, law, Materials Chemistry, Density of states, Optoelectronics, Electrical and Electronic Engineering, Scanning tunneling microscope, business |
| الوصف: | The effects of several ex vacuo methods used in the surface preparation of Cd1−x Zn x Te (CZT) have been studied using noncontact atomic force microscopy, scanning tunneling microscopy, and scanning tunneling spectroscopy. Preparation techniques include mechanical lapping, hydroplane bromine-methanol polishing, and in vacuo annealing. The morphology, electrical homogeneity, and local density of states (LDOS) have been studied for each preparation method. Impurities and oxides quickly form on the surface after each preparation method. Annealing in ultrahigh vacuum causes the surface electronic structure to become inhomogeneous whilst the LDOS suggests a compositional change from an oxide surface to p-type CZT. |
| تدمد: | 1543-186X 0361-5235 |
| DOI: | 10.1007/s11664-009-0693-7 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::9f7c3bd5198aa551428d1812e413d447 https://doi.org/10.1007/s11664-009-0693-7 |
| Rights: | CLOSED |
| رقم الانضمام: | edsair.doi...........9f7c3bd5198aa551428d1812e413d447 |
| قاعدة البيانات: | OpenAIRE |
| تدمد: | 1543186X 03615235 |
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| DOI: | 10.1007/s11664-009-0693-7 |