High-precision parallel-beam X-ray system for high-temperature diffraction studies

التفاصيل البيبلوغرافية
العنوان: High-precision parallel-beam X-ray system for high-temperature diffraction studies
المؤلفون: Toru Mitsunaga, Mari Saigo, Go Fujinawa
المصدر: Powder Diffraction. 17:173-177
بيانات النشر: Cambridge University Press (CUP), 2002.
سنة النشر: 2002
مصطلحات موضوعية: Diffraction, Spectrum analyzer, Phase transition, Radiation, Materials science, business.industry, X-ray, Analytical chemistry, Condensed Matter Physics, Thermal expansion, symbols.namesake, Optics, Lattice (order), symbols, General Materials Science, business, Instrumentation, Electron backscatter diffraction, Debye
الوصف: A recently developed Rigaku parallel-beam X-ray diffraction system equipped with a parabolic graded-multilayer mirror in the incident beam and a parallel-slits analyzer in the diffracted beam was used for precision high-temperature diffraction studies. The lattice parameters a and c of α-Al2O3 at room temperature and up to 1473 K were determined with precision in the range of 0.6–7.3×10−5. The thermal expansion coefficients for a and c agreed with literature values to better than 3%. The system was used successfully also to determine the Debye characteristic temperature of Si and to study structural phase transition of LaCoO3 from rhombohedral at room temperature to cubic at 1700 K.
تدمد: 1945-7413
0885-7156
DOI: 10.1154/1.1471519
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9d2e8f54a6c1b2540b72527a4b0b1450
https://doi.org/10.1154/1.1471519
Rights: CLOSED
رقم الانضمام: edsair.doi...........9d2e8f54a6c1b2540b72527a4b0b1450
قاعدة البيانات: OpenAIRE
الوصف
تدمد:19457413
08857156
DOI:10.1154/1.1471519