Single charge-pump generating high positive and negative voltages driving common load

التفاصيل البيبلوغرافية
العنوان: Single charge-pump generating high positive and negative voltages driving common load
المؤلفون: F. Desantis, Marco Pasotti, Vikas Rana
المصدر: VLSI-SoC
بيانات النشر: IEEE, 2017.
سنة النشر: 2017
مصطلحات موضوعية: Resistive touchscreen, Materials science, business.industry, Capacitive sensing, 020208 electrical & electronic engineering, Transistor, Electrical engineering, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, law.invention, Hardware_GENERAL, law, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Charge pump, business, NMOS logic, Hardware_LOGICDESIGN, EEPROM, Electronic circuit, Voltage
الوصف: A new architecture of charge-pump circuit is discussed that can be used to generate high positive and negative voltages to drive a common load (Load can be capacitive, resistive or both). Basic cell used for charge-pump consists of two phase clock signals, charge transfer NMOS transistors and bootstrapped configuration to boost the gate drive of NMOS transistors. Due to use of NMOS transistors, output resistance of circuit is lower than conventional circuits thus able to drive high load current. Electrical conditions of all devices used in the circuit is managed in such a way that there is no electrical stress across any transistor. Circuit is design and implemented in BCD-110nm technology using conventional (No DMOS) transistors.
DOI: 10.1109/vlsi-soc.2017.8203476
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9219ff4ac86010a4b9ea38f64911998d
https://doi.org/10.1109/vlsi-soc.2017.8203476
رقم الانضمام: edsair.doi...........9219ff4ac86010a4b9ea38f64911998d
قاعدة البيانات: OpenAIRE
الوصف
DOI:10.1109/vlsi-soc.2017.8203476