Label-free hyperspectral dark-field microscopy for quantitative scatter imaging

التفاصيل البيبلوغرافية
العنوان: Label-free hyperspectral dark-field microscopy for quantitative scatter imaging
المؤلفون: Jeeseong Hwang, Stephen C. Kanick, Paul Lemaillet, Daniel V. Samarov, David M. McClatchy, Philip P. Cheney, Brian W. Pogue, David W. Allen
المصدر: SPIE Proceedings.
بيانات النشر: SPIE, 2017.
سنة النشر: 2017
مصطلحات موضوعية: Chemical imaging, Materials science, Microscope, genetic structures, Diffuse reflectance infrared fourier transform, Scattering, business.industry, Hyperspectral imaging, 02 engineering and technology, 01 natural sciences, Dark field microscopy, Light scattering, law.invention, 010309 optics, 020210 optoelectronics & photonics, Optics, law, 0103 physical sciences, Microscopy, 0202 electrical engineering, electronic engineering, information engineering, business
الوصف: A hyperspectral dark-field microscope has been developed for imaging spatially distributed diffuse reflectance spectra from light-scattering samples. In this report, quantitative scatter spectroscopy is demonstrated with a uniform scattering phantom, namely a solution of polystyrene microspheres. A Monte Carlo-based inverse model was used to calculate the reduced scattering coefficients of samples of different microsphere concentrations from wavelength-dependent backscattered signal measured by the dark-field microscope. The results are compared to the measurement results from a NIST double-integrating sphere system for validation. Ongoing efforts involve quantitative mapping of scattering and absorption coefficients in samples with spatially heterogeneous optical properties.
تدمد: 0277-786X
DOI: 10.1117/12.2263336
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::722f63dee7cf25a046a0022094994901
https://doi.org/10.1117/12.2263336
رقم الانضمام: edsair.doi...........722f63dee7cf25a046a0022094994901
قاعدة البيانات: OpenAIRE
الوصف
تدمد:0277786X
DOI:10.1117/12.2263336