Approximate Boundary Conditions for the Problem of Calculating Optical Coefficients of Ultrathin Metallic Films in the Microwave and Terahertz Ranges
| العنوان: | Approximate Boundary Conditions for the Problem of Calculating Optical Coefficients of Ultrathin Metallic Films in the Microwave and Terahertz Ranges |
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| المؤلفون: | V. A. Vdovin, Valery G. Andreev, P. S. Glazunov |
| المصدر: | Optics and Spectroscopy. 128:1439-1448 |
| بيانات النشر: | Pleiades Publishing Ltd, 2020. |
| سنة النشر: | 2020 |
| مصطلحات موضوعية: | 010302 applied physics, Materials science, Computer simulation, business.industry, Physics::Optics, Substrate (electronics), Conductivity, 01 natural sciences, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Computational physics, 010309 optics, 0103 physical sciences, Transmittance, Boundary value problem, Photonics, business, Microwave, Fabry–Pérot interferometer |
| الوصف: | We report on the approximate boundary conditions obtained for the problem of calculating the optical coefficients of a system consisting of a dielectric substrate and an inhomogeneous ultrathin metallic film with an arbitrary thickness dependence of the conductivity deposited onto this substrate. The boundary conditions have been derived on the basis of the Picard’s method of successive approximations. Analytical expressions for estimating the error of the calculation of the optical coefficients obtained using the proposed approximate boundary conditions are presented. It is shown that the error increases with frequency and film thickness. The maximum error for 10-nm-thick films is no larger than 10.7% at a frequency of 1 THz. As an example, the complex optical coefficients of a system like the Fabry‒Perot etalon and a metallic film without a substrate with the model thickness dependence of the conductivity have been calculated. The coincidence of the results of the calculations performed by the numerical simulation and using the approximate boundary conditions is shown. The possibility of direct calculation of the average conductivity of a film using the experimental reflectance and transmittance is demonstrated. |
| تدمد: | 1562-6911 0030-400X |
| DOI: | 10.1134/s0030400x2009009x |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::6f337ebd7b9a11f80491b12f7954df72 https://doi.org/10.1134/s0030400x2009009x |
| Rights: | CLOSED |
| رقم الانضمام: | edsair.doi...........6f337ebd7b9a11f80491b12f7954df72 |
| قاعدة البيانات: | OpenAIRE |
| تدمد: | 15626911 0030400X |
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| DOI: | 10.1134/s0030400x2009009x |